Abstract
With their large scan range and low drive voltages, electrothermally- actuated micromirrors have great potential in optical biomedical imaging applications, but the repeatability and reliability of such micromirrors are not well understood. This paper reports the conditions for achieving repeatability of the embedded resistive heater and the mirror tilt angle of an electrothermal bimorph micromirror. The upper limit of the actuation voltage that does not degrade the embedded heater performance has been established.
Original language | English |
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Title of host publication | 2009 IEEE International Reliability Physics Symposium, IRPS 2009 |
Pages | 549-556 |
Number of pages | 8 |
DOIs | |
Publication status | Published - 2009 |
Externally published | Yes |
Event | 2009 IEEE International Reliability Physics Symposium, IRPS 2009 - Montreal, QC, Canada Duration: 26 Apr 2009 → 30 Apr 2009 |
Publication series
Name | IEEE International Reliability Physics Symposium Proceedings |
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ISSN (Print) | 1541-7026 |
Conference
Conference | 2009 IEEE International Reliability Physics Symposium, IRPS 2009 |
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Country/Territory | Canada |
City | Montreal, QC |
Period | 26/04/09 → 30/04/09 |
Keywords
- Bimorph
- Burn-in
- Electrothermal
- MEMS
- Microelectromechanical devices
- Micromirrors
- Reliability
- Repeatability
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Pal, S., & Xie, H. (2009). Repeatability study of an electrothermally actuated micromirror. In 2009 IEEE International Reliability Physics Symposium, IRPS 2009 (pp. 549-556). Article 5173309 (IEEE International Reliability Physics Symposium Proceedings). https://doi.org/10.1109/IRPS.2009.5173309