Reliability of high energy density ceramic capacitors

Xiaojuan Wu, Yajun Wang*, Qingxuan Zeng

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

9 Citations (Scopus)

Abstract

This paper discusses the reliability of the high energy storage density ceramic capacitor full of concept, and points out the failure modes and the possible causes. Failure analysis and reliability evaluation for ceramic capacitors are also given. The failure modes and failure mechanisms were studied in order to estimate component life and failure rate, and the failure criticality is considered to estimate failure effect, which provide information feedback and ensure the quality of the products. The research results can be applied as references to the estimation. In the end, a simple proposal is put forward, and particular emphasis should be placed on breakdown phenomena.

Original languageEnglish
Pages (from-to)998-1003
Number of pages6
JournalProcedia Engineering
Volume45
DOIs
Publication statusPublished - 2012
Event2012 8th International Symposium on Safety Science and Technology, ISSST 2012 - Nanjing, Jiangsu, China
Duration: 23 Oct 201226 Oct 2012

Keywords

  • Breakdown strength
  • Ceramic capacitors
  • High energy density
  • Reliability

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