@inproceedings{c97ad9a6a31144b5bc526699f3303e55,
title = "Reliability evaluation based on historical batch information",
abstract = "Reliability evaluation for highly reliable products is very difficult, especially for limited degradation data. In this cases, using the information from historical degradation data to improve the accuracy of reliability estimation for high reliability system is an effectiveness way. This paper proposes a method to analyze the reliability of products with few current batch data but abundant historical batch data. With the assumption that different batches of the product have the same failure mechanism, we use the Wiener process to model the degradation path of the historical batch data and apply these results to improving the reliability estimation accuracy of the current batch. The simulation results are also shown to confirm the feasibility and effectiveness of the proposed method. Finally, we give a practical application for a kind of Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET) and obtain its reliability function.",
keywords = "degradation, historical information, reliability, wiener process",
author = "Wenda Kang and Houbao Xu and Huiling Zheng",
note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020 ; Conference date: 20-08-2020 Through 23-08-2020",
year = "2020",
month = aug,
doi = "10.1109/APARM49247.2020.9209563",
language = "English",
series = "2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "2020 Asia-Pacific International Symposium on Advanced Reliability and Maintenance Modeling, APARM 2020",
address = "United States",
}