TY - GEN
T1 - Reliability Analysis for MOSFET Based on Wiener Process
AU - Zheng, Huiling
AU - Xu, Houbao
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/7/2
Y1 - 2018/7/2
N2 - In this paper, we study a kind of accelerated degradation model, and put forward a statistic to test the homogeneous of the variance based on Wiener process. Firstly, Wiener process is applied to model the degradation process of the deteriorating system, and the analytical expressions of probability density function and reliability function for such system are derived. The MLE (Maximum Likelihood Estimation) algorithm is also presented to estimate the model parameters. Then, by means of homogeneity test of variance, we can judge whether the failure mechanism of the products is changed or not, which is the basis for the extrapolation of the characteristic quantity. A simulation study is given to illustrate the effectiveness of the proposed method. Finally, we use this method to analyze the degradation data of the MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and get its reliability under normal working condition.
AB - In this paper, we study a kind of accelerated degradation model, and put forward a statistic to test the homogeneous of the variance based on Wiener process. Firstly, Wiener process is applied to model the degradation process of the deteriorating system, and the analytical expressions of probability density function and reliability function for such system are derived. The MLE (Maximum Likelihood Estimation) algorithm is also presented to estimate the model parameters. Then, by means of homogeneity test of variance, we can judge whether the failure mechanism of the products is changed or not, which is the basis for the extrapolation of the characteristic quantity. A simulation study is given to illustrate the effectiveness of the proposed method. Finally, we use this method to analyze the degradation data of the MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and get its reliability under normal working condition.
KW - ADT
KW - Reliability analysis
KW - Variance homogeneity test
KW - Wiener process
UR - http://www.scopus.com/inward/record.url?scp=85061801667&partnerID=8YFLogxK
U2 - 10.1109/IEEM.2018.8607752
DO - 10.1109/IEEM.2018.8607752
M3 - Conference contribution
AN - SCOPUS:85061801667
T3 - IEEE International Conference on Industrial Engineering and Engineering Management
SP - 197
EP - 201
BT - 2018 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2018
PB - IEEE Computer Society
T2 - 2018 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2018
Y2 - 16 December 2018 through 19 December 2018
ER -