Abstract
A refractive index measuring guage based on the white-light interferometry is developed for the measurement of refractive index of small size, smooth and transparent materials. Compared with traditional refractive index detection methods, the guage has many advantages, such as smaller size, higher accuracy, simple operation and portable. Experiment results show that the index of quartz is 1.464 and the deviationis 1.4%, the index of SiO2 is 1.502 and the deviation is 0.1%, the index of K9 glass is 1.507 and the deviation is 0.6%.
Original language | English |
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Pages (from-to) | 487-490 |
Number of pages | 4 |
Journal | Guangxue Jishu/Optical Technique |
Volume | 42 |
Issue number | 6 |
Publication status | Published - 1 Nov 2016 |
Keywords
- EFPI
- Optical fiber white-light interferometry technology
- Refractive index