Reduction of lasing threshold by protecting gas and the structure dependent visual lasing mode of various CdS microstructures

Ya Li, Shuai Guo, Fangyin Zhao, An Li, Ke Chai, Liang Liang, Ruibin Liu*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The lasing behaviours of semiconductor micro/nanostructures were studied in different gaseous surroundings, and the lasing threshold of the nanowire was reduced from 10.5 MW/cm2 in air to 9.82 MW/cm2, 8.25 MW/cm2 and 7.22 MW/cm2 in Ar, N2 and He environment, respectively. It is attributed to the transient polarization of molecular gas. Moreover, the narrow-bandwidth lasing from the junction of a comb-like microstructure is hard to realize compared to that in nanowire and nanobelt due to the absence of good resonance cavities, and the only amplified spontaneous emission was observed by the ICCD dynamic images of the photoluminescence. The PL spectra and ICCD dynamic images, as well as lifetime measurement, prove the occurrence of lasing in nanowires and nanobelts with the pumping power increase, which should originate from the exciton-electron scattering and the formation of EHP, respectively. The whispering-gallery-mode lasing in nanowire and Fabry-Perot-Mode lasing in nanobelt were intuitively demonstrated by the ICCD images. The results provide one route to reduce the lasing threshold by the gas protection.

Original languageEnglish
Pages (from-to)26857-26866
Number of pages10
JournalOptics Express
Volume24
Issue number23
DOIs
Publication statusPublished - 14 Nov 2016

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