Radar target signature processing while measuring in near field

Hu Weidong; Sun Houjun; Lv Xin; Li Shiyong

doi:10.1109/ICOSP.2006.346011

Radar target signature processing while measuring in near field

Hu Weidong^*, Sun Houjun, Lv Xin, Li Shiyong

^*Corresponding author for this work

School of Integrated Circuits and Electronics

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown; The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be got, which is a trend.

Original language	English
Title of host publication	8th International Conference on Signal Processing, ICSP 2006
DOIs	https://doi.org/10.1109/ICOSP.2006.346011
Publication status	Published - 2007
Event	8th International Conference on Signal Processing, ICSP 2006 - Guilin, China Duration: 16 Nov 2006 → 20 Nov 2006

Publication series

Name	International Conference on Signal Processing Proceedings, ICSP
Volume	4

Conference

Conference	8th International Conference on Signal Processing, ICSP 2006
Country/Territory	China
City	Guilin
Period	16/11/06 → 20/11/06

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10.1109/ICOSP.2006.346011

Cite this

@inproceedings{0dedeccdab464d3489ef8d1c26417ee3,

title = "Radar target signature processing while measuring in near field",

abstract = "Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown; The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be got, which is a trend.",

author = "Hu Weidong and Sun Houjun and Lv Xin and Li Shiyong",

year = "2007",

doi = "10.1109/ICOSP.2006.346011",

language = "English",

isbn = "0780397371",

series = "International Conference on Signal Processing Proceedings, ICSP",

booktitle = "8th International Conference on Signal Processing, ICSP 2006",

note = "8th International Conference on Signal Processing, ICSP 2006 ; Conference date: 16-11-2006 Through 20-11-2006",

}

Weidong, H , Houjun, S, Xin, L & Shiyong, L 2007, Radar target signature processing while measuring in near field. in 8th International Conference on Signal Processing, ICSP 2006., 4129703, International Conference on Signal Processing Proceedings, ICSP, vol. 4, 8th International Conference on Signal Processing, ICSP 2006, Guilin, China, 16/11/06. https://doi.org/10.1109/ICOSP.2006.346011

TY - GEN

T1 - Radar target signature processing while measuring in near field

AU - Weidong, Hu

AU - Houjun, Sun

AU - Xin, Lv

AU - Shiyong, Li

PY - 2007

Y1 - 2007

N2 - Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown; The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be got, which is a trend.

AB - Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown; The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be got, which is a trend.

UR - http://www.scopus.com/inward/record.url?scp=34249298688&partnerID=8YFLogxK

U2 - 10.1109/ICOSP.2006.346011

DO - 10.1109/ICOSP.2006.346011

M3 - Conference contribution

AN - SCOPUS:34249298688

SN - 0780397371

SN - 9780780397378

T3 - International Conference on Signal Processing Proceedings, ICSP

BT - 8th International Conference on Signal Processing, ICSP 2006

T2 - 8th International Conference on Signal Processing, ICSP 2006

Y2 - 16 November 2006 through 20 November 2006

ER -

Radar target signature processing while measuring in near field

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