Processing application used in beam characterization

Wei Sun*, Chunqing Gao, Guanghui Wei

*Corresponding author for this work

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Abstract

CCD based laser beam characterization system is widely used in many experimental and industrial applications. Besides many factors of the CCD measurement system and the properties of the beam's power density distributions to be measured, the obtained accuracy of laser beam characterization also strongly depends on the effectiveness of data processing algorithm. In this paper a Windows based processing application and its features and key processing algorithm are introduced, and also a software related proposal is raised, such as common interface of measurement on simulated beam with given beam width, background and noise; universal image data storage format which would facilitate the international wide collaboration on the effectiveness evaluation of different processing application and system.

Original languageEnglish
Pages (from-to)81-86
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume4222
DOIs
Publication statusPublished - 2000
EventProcess Control and Inspection for Industry - Beijing, China
Duration: 8 Nov 200010 Nov 2000

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Sun, W., Gao, C., & Wei, G. (2000). Processing application used in beam characterization. Proceedings of SPIE - The International Society for Optical Engineering, 4222, 81-86. https://doi.org/10.1117/12.403897