Plane Defect Detection Based on 3D Point Cloud

Mingsong Bai, Shuang Wu, Hongbin Ma*, Ying Jin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the production of industrial products, surface defect detection is mostly carried out through manual inspection. However, this detection method has several shortcomings, such as low efficiency, limited accuracy, and high inspection costs. To address these issues, we design an improved random sampling consistency (RANSAC) algorithm based on adaptive parameters of 3D point cloud data for plane defect detection. The main steps of our algorithm include the down sampling function which contains adaptive parameters, optimized based on KD-tree proximity substitution method. Our algorithm also includes the RANSAC segmentation and fitting plane function of adaptive parameters. Experimental results demonstrate that our algorithm can accurately identify protrusions or indentations defects of 1 mm or larger in those planes based on point clouds data, with a recognition rate more than 90%. The experimental results validate the suitability of our algorithm for industrial applications, offering an efficient and cost-effective solution for plane defect detection.

Original languageEnglish
Title of host publicationAdvanced Computational Intelligence and Intelligent Informatics - 8th International Workshop, IWACIII 2023, Proceedings
EditorsBin Xin, Naoyuki Kubota, Kewei Chen, Fangyan Dong
PublisherSpringer Science and Business Media Deutschland GmbH
Pages57-69
Number of pages13
ISBN (Print)9789819975921
DOIs
Publication statusPublished - 2024
Event8th International Workshop on Advanced Computational Intelligence and Intelligent Informatics, IWACIII 2023 - Beijing, China
Duration: 3 Nov 20235 Nov 2023

Publication series

NameCommunications in Computer and Information Science
Volume1932 CCIS
ISSN (Print)1865-0929
ISSN (Electronic)1865-0937

Conference

Conference8th International Workshop on Advanced Computational Intelligence and Intelligent Informatics, IWACIII 2023
Country/TerritoryChina
CityBeijing
Period3/11/235/11/23

Keywords

  • Defect Detection
  • Point Cloud
  • Random Sample Consensus

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