Phase-field simulation of two-dimensional topological charges in nematic liquid crystals

Deshan Liang, Xingqiao Ma*, Zhuhong Liu, Hasnain Mehdi Jafri, Guoping Cao, Houbing Huang, Sanqiang Shi, Long Qing Chen

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

The concept of topological quantum number, or topological charge, has been used extensively to describe topological defects or solitons. Nematic liquid crystals contain both integer and half-integer topological defects, making them useful models for testing the rules that govern topological defects. Here, we investigated topological defects in nematic liquid crystals using the phase-field method. If there are no defects along a loop path, the total charge number is described by an encircled loop integral. We found that the total charge number is conserved, and the conservation of defects number is determined by a boundary during the generation and annihilation of positive-negative topological defects when the loop integral is confined. These rules can be extended to other two-dimensional systems with topological defects.

Original languageEnglish
Article number124701
JournalJournal of Applied Physics
Volume128
Issue number12
DOIs
Publication statusPublished - 28 Sept 2020

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