Phase extraction based on sinusoidal extreme strip phase shifting method

Mei Hui*, Ming Liu, Liquan Dong, Xiaohua Liu, Yuejin Zhao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Multiple synthetic aperture imaging can enlarge pupil diameter of optical systems, and increase system resolution. Multiple synthetic aperture imaging is a cutting-edge topic and research focus in recent years, which is prospectively widely applied in fields like astronomical observations and aerospace remote sensing. In order to achieve good imaging quality, synthetic aperture imaging system requires phase extraction of each sub-aperture and co-phasing of whole aperture. In the project, an in-depth study about basic principles and methods of segments phase extraction was done. The study includes: application of sinusoidal extreme strip light irradiation phase shift method to extract the central dividing line to get segment phase extraction information, and the use of interference measurement to get the aperture phase extraction calibration coefficients of spherical surface. Study about influence of sinusoidal extreme strip phase shift on phase extraction, and based on sinusoidal stripe phase shift from multiple linear light sources of the illumination reflected image, to carry out the phase shift error for inhibiting the effect in the phase extracted frame.

Original languageEnglish
Title of host publication2015 International Conference on Optical Instruments and Technology
Subtitle of host publicationOptoelectronic Measurement Technology and Systems, OIT 2015
EditorsKexin Xu, Hai Xiao, Jigui Zhu, Hwa-Yaw Tam, Sen Han
PublisherSPIE
ISBN (Electronic)9781628418040
DOIs
Publication statusPublished - 2015
Event2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015 - Beijing, China
Duration: 17 May 201519 May 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9623
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, OIT 2015
Country/TerritoryChina
CityBeijing
Period17/05/1519/05/15

Keywords

  • phase extraction
  • phase shift error
  • phase shifting
  • segments
  • sinusoidal strip

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