On the theory of temporal aberrations for electron optical imaging systems by using "direct integral method"

Liwei Zhou*, Yuan Li, Zhiquan Zhang, M. A. Monastyrski, M. Ya Schelev

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

2 Citations (Scopus)

Abstract

A new approach to the theory of temporal aberration for the dynamic electron optical imaging systems is given in the present paper. A new definition of temporal aberrations is given in which a certain initial energy of electron emission along the axial direction εz1 (0 ≤ εz1 ≤ ε0max) is considered. A new method to calculate the temporal aberration coefficients of dynamic electron optical imaging system, which is named "Direct Integral Method", is also presented. All of the formulae of the temporal aberration coefficients deduced from "Direct Integral Method" and "τ-Variation Method" have been verified by an electrostatic concentric spherical system model, and contrasted with the analytical solutions. Results show that these two methods have got identical solution and the solutions of temporal aberration coefficients of first and second-order are the same with the analytical solutions. Thus it can be concluded these two methods given by us are equivalent and correct, but the "Direct Integral Method" is related to solve integral expressions, which is more convenient for computation and could be suggested to use in the practical design.

Original languageEnglish
Article number83
Pages (from-to)710-724
Number of pages15
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5580
DOIs
Publication statusPublished - 2005
Event26th International Congress on High-Speed Photography and Photonics - Alexandria, VA, United States
Duration: 20 Sept 200424 Sept 2004

Keywords

  • Cathode lenses
  • Dynamic electron optics
  • Electron optical imaging system
  • Theory of temporal aberrations
  • Time transit spread

Fingerprint

Dive into the research topics of 'On the theory of temporal aberrations for electron optical imaging systems by using "direct integral method"'. Together they form a unique fingerprint.

Cite this