@inproceedings{9688b1b7852240f0b8b9169f514aef69,
title = "Nonparametric variance control charts based on siegel-tukey test",
abstract = "To monitor the process variance in a distribution-free way is important, but relative research is still lack in the literature. We propose some new nonparametric control charts based on Siegel-Tukey test. The proposed charts can detect shifts in process variance, and the in-control performance will not be affected by the underlying process distribution. We compare the out-of-control performance to the parametric control charts and the results are convincing. We also give a numerical example to show how the charts work.",
keywords = "Distribution-free, Phase II chart, Quality Control, Rank-Sum test, Simulation",
author = "Suyi Li",
note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017 ; Conference date: 10-12-2017 Through 13-12-2017",
year = "2017",
month = jul,
day = "2",
doi = "10.1109/IEEM.2017.8290316",
language = "English",
series = "IEEE International Conference on Industrial Engineering and Engineering Management",
publisher = "IEEE Computer Society",
pages = "2371--2374",
booktitle = "2017 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2017",
address = "United States",
}