Noise identification and analysis in MEMS sensors using an optimized variable step Allan variance

Yitong Zhang, Shuli Guo, Qiming Chen, Lina Han*, Quanjin Si

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

The Allan variance is a method of representing different noise terms imposed by the stochastic fluctuations as a function of averaging time. Unfortunately, existing implementations indicate that with the length of the analyzed datasets increasing, the computation time grows very fast. This paper presents an optimized variable step Allan variance method by changing the step length of the cluster sequence. In order to verify its validity, a series of 2-hour static data collected from Microelectromechanical Systems (MEMS) sensors are identified by the optimized algorithm and the classical one, and also applied to Dynamic Allan Variance (DAVAR) to track time-varying stability of sensors. Experiment results demonstrate that proposed algorithm could significantly speed up the estimation process of Allan variance while ensuring the accuracy of the analysis results, and enable the Allan variance becomes more efficient in practical applications.

Original languageEnglish
Title of host publicationProceedings of the 38th Chinese Control Conference, CCC 2019
EditorsMinyue Fu, Jian Sun
PublisherIEEE Computer Society
Pages6309-6314
Number of pages6
ISBN (Electronic)9789881563972
DOIs
Publication statusPublished - Jul 2019
Event38th Chinese Control Conference, CCC 2019 - Guangzhou, China
Duration: 27 Jul 201930 Jul 2019

Publication series

NameChinese Control Conference, CCC
Volume2019-July
ISSN (Print)1934-1768
ISSN (Electronic)2161-2927

Conference

Conference38th Chinese Control Conference, CCC 2019
Country/TerritoryChina
CityGuangzhou
Period27/07/1930/07/19

Keywords

  • Allan variance
  • Coefficient identification
  • MEMS sensor
  • Stochastic error

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