New method for measurement of waveform capture rate using random signal

Qinchuan Zhang, Min Li, Jinpeng Song, Kuojun Yang, Jia Zhao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Waveform capture rate is one of the most important indicators of digital storage oscilloscope, representing the ability of the system to capture waveforms in unit time. But for the actual acquisition systems, it is difficult to measure this indicator only by its external characteristics. In this paper, by analyzing the relation between the waveform capture rate and the dead-time of DSO, the new measurement method based on random pulse signal for waveform capture rate is proposed, and then this method has been verified in the actual system and gives the test results accordingly.

Original languageEnglish
Title of host publication2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
EditorsCui Jianping, Wu Juan
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages999-1003
Number of pages5
ISBN (Electronic)9781479976195
DOIs
Publication statusPublished - 16 Jun 2016
Externally publishedYes
Event12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015 - Qingdao, China
Duration: 16 Jul 201518 Jul 2015

Publication series

Name2015 IEEE 12th International Conference on Electronic Measurement and Instruments, ICEMI 2015
Volume2

Conference

Conference12th IEEE International Conference on Electronic Measurement and Instruments, ICEMI 2015
Country/TerritoryChina
CityQingdao
Period16/07/1518/07/15

Keywords

  • Monte Carlo method
  • dead-time
  • digital storage oscilloscope
  • random pulse signal
  • waveform capture rate

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