@inproceedings{eb9d497e8df1430786a22d1c670fdd14,
title = "Nanometer profile measurement of aspheric surface using scanning deflectometry and rotating autocollimator: Self-calibration method of autocollimator",
author = "Kiyoshi Takamasu and Kyohei Ishikawa and Tomihiko Takamura and Muzheng Xiao and Satoru Takahashi",
year = "2014",
language = "English",
isbn = "9781887706650",
series = "Proceedings - ASPE/ASPEN Summer Topical Meeting: Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces",
publisher = "American Society for Precision Engineering, ASPE",
pages = "121--125",
booktitle = "Proceedings - ASPE/ASPEN Summer Topical Meeting",
note = "Joint Meeting of the American Society for Precision Engineering (ASPE) and the Asian Society for Precision Engineering (ASPEN) on Manufacture and Metrology of Freeform and Off-Axis Aspheric Surfaces - 2014 Summer Topical Meeting ; Conference date: 26-06-2014 Through 27-06-2014",
}