Multiple reflection error analysis for planar near field measurement in time domain

Meng Cao; Zhenghui Xue; Wu Ren; Weiming Li; Ruoqing Zhu; Hongwei Cai

doi:10.1109/CAMA.2016.7815812

Multiple reflection error analysis for planar near field measurement in time domain

Meng Cao, Zhenghui Xue, Wu Ren, Weiming Li, Ruoqing Zhu, Hongwei Cai

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Citations (Scopus)

Abstract

Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.

Original language	English
Title of host publication	2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781467389327
DOIs	https://doi.org/10.1109/CAMA.2016.7815812
Publication status	Published - 12 Jan 2017
Event	2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016 - Syracuse, United States Duration: 23 Oct 2016 → 27 Oct 2016

Publication series

Name	2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016

Conference

Conference	2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016
Country/Territory	United States
City	Syracuse
Period	23/10/16 → 27/10/16

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10.1109/CAMA.2016.7815812

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Cao, M., Xue, Z., Ren, W., Li, W., Zhu, R., & Cai, H. (2017). Multiple reflection error analysis for planar near field measurement in time domain. In 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016 Article 7815812 (2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/CAMA.2016.7815812

@inproceedings{81a88a15139b478cab8220ec36c3be37,

title = "Multiple reflection error analysis for planar near field measurement in time domain",

abstract = "Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.",

author = "Meng Cao and Zhenghui Xue and Wu Ren and Weiming Li and Ruoqing Zhu and Hongwei Cai",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016 ; Conference date: 23-10-2016 Through 27-10-2016",

year = "2017",

month = jan,

day = "12",

doi = "10.1109/CAMA.2016.7815812",

language = "English",

series = "2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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Cao, M, Xue, Z , Ren, W , Li, W, Zhu, R & Cai, H 2017, Multiple reflection error analysis for planar near field measurement in time domain. in 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016., 7815812, 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016, Institute of Electrical and Electronics Engineers Inc., 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016, Syracuse, United States, 23/10/16. https://doi.org/10.1109/CAMA.2016.7815812

Multiple reflection error analysis for planar near field measurement in time domain. / Cao, Meng; Xue, Zhenghui ; Ren, Wu et al.
2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016. Institute of Electrical and Electronics Engineers Inc., 2017. 7815812 (2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Multiple reflection error analysis for planar near field measurement in time domain

AU - Cao, Meng

AU - Xue, Zhenghui

AU - Ren, Wu

AU - Li, Weiming

AU - Zhu, Ruoqing

AU - Cai, Hongwei

PY - 2017/1/12

Y1 - 2017/1/12

N2 - Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.

AB - Multiple reflection signals between the probe and the antenna is always ignored in frequency domain near field measurement, which can be reduced by technique such as time gate in the time domain near field measurement sometimes. There are few articles to study about influence of the multiple reflection error affecting the result of the test for it is difficult to determine multiple reflection signals in the frequency domain. In this paper multiple reflection signals is studied by analyze the signals in the port of antenna under test (AUT). The multiple reflection signals with different probe in different position are shown, and then influence of each parameter of probe is presented.

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U2 - 10.1109/CAMA.2016.7815812

DO - 10.1109/CAMA.2016.7815812

M3 - Conference contribution

AN - SCOPUS:85013167914

T3 - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016

BT - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016

Y2 - 23 October 2016 through 27 October 2016

ER -

Cao M, Xue Z , Ren W , Li W, Zhu R, Cai H. Multiple reflection error analysis for planar near field measurement in time domain. In 2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016. Institute of Electrical and Electronics Engineers Inc. 2017. 7815812. (2016 IEEE Conference on Antenna Measurements and Applications, CAMA 2016). doi: 10.1109/CAMA.2016.7815812

Multiple reflection error analysis for planar near field measurement in time domain

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