Abstract
This paper presents a newly invented multi-section auto-focus millimeter wave holography scheme by using a single frequency signal. Both simulation and demonstration results are provided and compared with conventional holography and wideband imaging. This new multi-section auto-focus holography scheme demonstrates much better imaging resolution than conventional holography, has the similar imaging quality as the wideband imaging, but with one order less processing time and much simpler hardware requirement.
Original language | English |
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Title of host publication | 2016 IEEE MTT-S International Microwave Symposium, IMS 2016 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781509006984 |
DOIs | |
Publication status | Published - 9 Aug 2016 |
Event | 2016 IEEE MTT-S International Microwave Symposium, IMS 2016 - San Francisco, United States Duration: 22 May 2016 → 27 May 2016 |
Publication series
Name | IEEE MTT-S International Microwave Symposium Digest |
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Volume | 2016-August |
ISSN (Print) | 0149-645X |
Conference
Conference | 2016 IEEE MTT-S International Microwave Symposium, IMS 2016 |
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Country/Territory | United States |
City | San Francisco |
Period | 22/05/16 → 27/05/16 |
Keywords
- Auto-focus
- Holography
- Imaging
- Millimeter-wave
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Cheng, H., Gu, J., Cheng, Y., Li, S., & Sun, H. (2016). Multi-section auto-focus millimeter-wave holography. In 2016 IEEE MTT-S International Microwave Symposium, IMS 2016 Article 7540258 (IEEE MTT-S International Microwave Symposium Digest; Vol. 2016-August). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MWSYM.2016.7540258