@inproceedings{f7d079f46ada4379924dae3534b58580,
title = "Modelling and characterization of dynamic behavior of coupled memristor circuits",
abstract = "This paper explores the dynamic behavior of dual flux coupled memristor circuits in order to further ascertain fundamental theory of memristor circuits. Different cases of flux coupling are mathematically modelled where two memristors are connected in both series and parallel, with consideration given to the polarity of each device. The dynamic behavior is characterized based on the constitutive relations, with a variation of memductance represented in terms of flux, charge, voltage and current. The agreement between theoretical and simulation analyses affirm the memristor closure theorem with coupled memristor circuits behaving as a different type of memristor with higher complexity.",
keywords = "coupling strength, memductance, memristor, parallel connection, serial connection",
author = "Eshraghian, {Jason K.} and Iu, {Herbert H.C.} and Tyrone Fernando and Dongsheng Yu and Zhen Li",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 2016 IEEE International Symposium on Circuits and Systems, ISCAS 2016 ; Conference date: 22-05-2016 Through 25-05-2016",
year = "2016",
month = jul,
day = "29",
doi = "10.1109/ISCAS.2016.7527334",
language = "English",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "690--693",
booktitle = "ISCAS 2016 - IEEE International Symposium on Circuits and Systems",
address = "United States",
}