Miniature radio frequency ion trap mass spectrometry

Jeffrey D. Maas, Wei Xu, Paul Hendricks, William J. Chappell

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

RF ion traps are useful in chemical analysis and have added benefits when scaled to smaller dimensions. For a miniature ion trap it is ideal to be able to predict the performance of the ion trap prior to fabrication in order to save time and optimize parameters. We have developed both the simulation and fabrication of scaled ion traps. The simulation tool allows us to model miniature ion traps in order to predict how the frequency and amplitude of the RF voltage could be scaled in order to optimize the performance of the ion trap. We demonstrate the performance of a scaled ion trap array fabricated through the integration of stereolithography on circuit board and compare its performance with our ion trajectory simulator.

Original languageEnglish
Title of host publication2010 IEEE MTT-S International Microwave Symposium, MTT 2010
Pages1636-1639
Number of pages4
DOIs
Publication statusPublished - 2010
Externally publishedYes
Event2010 IEEE MTT-S International Microwave Symposium, MTT 2010 - Anaheim, CA, United States
Duration: 23 May 201028 May 2010

Publication series

NameIEEE MTT-S International Microwave Symposium Digest
ISSN (Print)0149-645X

Conference

Conference2010 IEEE MTT-S International Microwave Symposium, MTT 2010
Country/TerritoryUnited States
CityAnaheim, CA
Period23/05/1028/05/10

Keywords

  • Chemical analysis
  • Ion trap
  • Stereolithography

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