MEMS Gyroscope Noise Analysis and Calibration Using Allan Variance and Improved Hann Filter

Zhanyi Yan, Senchun Chai*, Liu Yang, Baihai Zhang, Lingguo Cui

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

MEMS gyroscope, as a component of low-cost ins devices, has been widely used in unmanned platforms and intelligent terminals. However, it suffers from interference from deterministic and random errors. In order to solve this problem, a noise analysis and calibration method of MEMS gyroscope based on Allan variance and improved Hann filter is proposed in this paper, and the effectiveness of the method is verified by experiments. The results show that the output is closer to the true value by improved method. After applying this method to the accelerometer as well, the absolute errors of the calculated pitch and roll angles decreased by 0.6825 and 0.3861, respectively.

Original languageEnglish
Title of host publicationProceedings of 2020 Chinese Intelligent Systems Conference - Volume II
EditorsYingmin Jia, Weicun Zhang, Yongling Fu
PublisherSpringer Science and Business Media Deutschland GmbH
Pages193-202
Number of pages10
ISBN (Print)9789811584572
DOIs
Publication statusPublished - 2021
EventChinese Intelligent Systems Conference, CISC 2020 - Shenzhen, China
Duration: 24 Oct 202025 Oct 2020

Publication series

NameLecture Notes in Electrical Engineering
Volume706 LNEE
ISSN (Print)1876-1100
ISSN (Electronic)1876-1119

Conference

ConferenceChinese Intelligent Systems Conference, CISC 2020
Country/TerritoryChina
CityShenzhen
Period24/10/2025/10/20

Keywords

  • Allan variance
  • Calibration
  • Improved Hann filter
  • MEMS gyroscope
  • Noise analysis

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Cite this

Yan, Z., Chai, S., Yang, L., Zhang, B., & Cui, L. (2021). MEMS Gyroscope Noise Analysis and Calibration Using Allan Variance and Improved Hann Filter. In Y. Jia, W. Zhang, & Y. Fu (Eds.), Proceedings of 2020 Chinese Intelligent Systems Conference - Volume II (pp. 193-202). (Lecture Notes in Electrical Engineering; Vol. 706 LNEE). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-981-15-8458-9_21