Location precision analysis of stereo thermal anti-sniper detection system

Yuqing He, Ya Lu, Xiaoyan Zhang, Weiqi Jin

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Abstract

Anti-sniper detection devices are the urgent requirement in modern warfare. The precision of the anti-sniper detection system is especially important. This paper discusses the location precision analysis of the anti-sniper detection system based on the dual-thermal imaging system. It mainly discusses the following two aspects which produce the error: the digital quantitative effects of the camera; effect of estimating the coordinate of bullet trajectory according to the infrared images in the process of image matching. The formula of the error analysis is deduced according to the method of stereovision model and digital quantitative effects of the camera. From this, we can get the relationship of the detecting accuracy corresponding to the system's parameters. The analysis in this paper provides the theory basis for the error compensation algorithms which are put forward to improve the accuracy of 3D reconstruction of the bullet trajectory in the anti-sniper detection devices.

Original languageEnglish
Title of host publicationInfrared Technology and Applications XXXVIII
PublisherSPIE
ISBN (Print)9780819490315
DOIs
Publication statusPublished - 2012
Externally publishedYes
Event38th Conference on Infrared Technology and Applications - Baltimore, MD, United States
Duration: 23 Apr 201227 Apr 2012

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8353
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference38th Conference on Infrared Technology and Applications
Country/TerritoryUnited States
CityBaltimore, MD
Period23/04/1227/04/12

Keywords

  • 3D reconstruction
  • Anti-sniper detection
  • Dual thermal imager
  • Precision analysis
  • Stereovision

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He, Y., Lu, Y., Zhang, X., & Jin, W. (2012). Location precision analysis of stereo thermal anti-sniper detection system. In Infrared Technology and Applications XXXVIII Article 83533I (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 8353). SPIE. https://doi.org/10.1117/12.920886