Abstract
We present successful experimental results from the first lateral capacitive accelerometer to be designed and manufactured in a conventional CMOS process. Compatibility with conventional CMOS provides advantages of low cost, high yield and fast prototyping that should be transferable to any CMOS foundry. A fully differential capacitive-bridge interface which can not be realized in polysilicon technology is designed and implemented. Out-of-plane curling associated with the composite structural layers is compensated to first order through a curl matching technique. The prototype accelerometer has a measured sensitivity of 1.2 mV/g and a 0.5 mg/rtHz noise floor at the output of the sensing element.
Original language | English |
---|---|
Pages | 606-611 |
Number of pages | 6 |
Publication status | Published - 1999 |
Externally published | Yes |
Event | Proceedings of the 1999 12th IEEE International Conference on Micro Electro Mechanical Systems, MEMS - Orlando, FL, USA Duration: 17 Jan 1999 → 21 Jan 1999 |
Conference
Conference | Proceedings of the 1999 12th IEEE International Conference on Micro Electro Mechanical Systems, MEMS |
---|---|
City | Orlando, FL, USA |
Period | 17/01/99 → 21/01/99 |