Inverse electromagnetic obstacle scattering problems with multi-frequency sparse backscattering far field data

Tilo Arens, Xia Ji*, Xiaodong Liu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Citations (Scopus)

Abstract

This paper is dedicated to design a direct sampling method of inverse electromagnetic scattering problems, which uses multi-frequency sparse backscattering far field data for reconstructing the boundaries of perfectly conducting obstacles. We show that the smallest strip containing the unknown object can be approximately determined by the multi-frequency backscattering far field data at two opposite observation directions. The proof is based on the Kirchhoff approximation and Fourier transform. Such a strip is then reconstructed by an indicator, which is the absolute value of an integral of the product of the data and some properly chosen function over the frequency interval. With the increase of the number of the backscattering data, the location and shape of the underlying object can be reconstructed. Numerical examples are conducted to show the validity and robustness of the proposed sampling method, even with moderately sized frequencies. The numerical examples also show that the concave part of the underlying object can be well reconstructed, and the different connected components of the underlying object can be well separated.

Original languageEnglish
Article number105007
JournalInverse Problems
Volume36
Issue number10
DOIs
Publication statusPublished - Oct 2020

Keywords

  • Direct sampling methods
  • Electromagnetic obstacle scattering
  • Sparse backscattering data
  • Uniqueness

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