Influence of the third-order parameter on diffuse reflectance at small source-detector separations

Huijuan Tian*, Ying Liu, Lijun Wang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Citations (Scopus)

Abstract

Spatially resolved reflectance close to source has received a great deal of attention recently. This research is considered to develop a new noninvasive technique for measuring the optical properties of biological media. Using Monte Carlo simulations, we investigated the influence of third-order parameter δ on diffuse reflectance and found that the reflectance decreased with an increase of δ at a short source-detector separation of approximately 0.7-2 transport mean free paths. We show that the effects of two parameters, γ and second-order parameter δ, on the reflectance are contrary. As a result the influence of the second-order parameter γ on the reflectance is irregular when the condition Δδ≪Δγ is not satisfied.

Original languageEnglish
Pages (from-to)933-935
Number of pages3
JournalOptics Letters
Volume31
Issue number7
DOIs
Publication statusPublished - 1 Apr 2006
Externally publishedYes

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