In-Situ Single-Photon Detection of Er Sites in Si

Ian R. Berkman*, Alexey Lyasota, Gabriele G. de Boo, John G. Bartholomew, Brett C. Johnson, Jeffrey C. McCallum, Bin Bin Xu, Shouyi Xie, Rose L. Ahlefeldt, Matthew J. Sellars, Chunming Yin, Sven Rogge

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

Abstract

Using sample-on-SSPD and photoluminescence excitation spectroscopy, we demonstrate Er sites in Si with inhomogeneous broadening below 100 MHz, a 350 kHz upper bound on the homogeneous linewidth, and electron T1 lower bound of 1 second.

Original languageEnglish
Article numberFM5D.5
JournalOptics InfoBase Conference Papers
Publication statusPublished - 2022
Externally publishedYes
EventCLEO: QELS_Fundamental Science, QELS 2022 - San Jose, United States
Duration: 15 May 202220 May 2022

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Berkman, I. R., Lyasota, A., de Boo, G. G., Bartholomew, J. G., Johnson, B. C., McCallum, J. C., Xu, B. B., Xie, S., Ahlefeldt, R. L., Sellars, M. J., Yin, C., & Rogge, S. (2022). In-Situ Single-Photon Detection of Er Sites in Si. Optics InfoBase Conference Papers, Article FM5D.5.