Abstract
Using sample-on-SSPD and photoluminescence excitation spectroscopy, we demonstrate Er sites in Si with inhomogeneous broadening below 100 MHz, a 350 kHz upper bound on the homogeneous linewidth, and electron T1 lower bound of 1 second.
Original language | English |
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Article number | FM5D.5 |
Journal | Optics InfoBase Conference Papers |
Publication status | Published - 2022 |
Externally published | Yes |
Event | CLEO: QELS_Fundamental Science, QELS 2022 - San Jose, United States Duration: 15 May 2022 → 20 May 2022 |
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Berkman, I. R., Lyasota, A., de Boo, G. G., Bartholomew, J. G., Johnson, B. C., McCallum, J. C., Xu, B. B., Xie, S., Ahlefeldt, R. L., Sellars, M. J., Yin, C., & Rogge, S. (2022). In-Situ Single-Photon Detection of Er Sites in Si. Optics InfoBase Conference Papers, Article FM5D.5.