Highly accurate metamaterial sensor for measurement of permittivity of nanoscale materials

Highly accurate metamaterial sensor for the measurement of permittivity of the nanoscale materials is proposed. The proposed sensor is designed and simulated on low cost substrate FR4 on using ANSYS HFSS simulation software. Two complementary split rectangular resonators (CSRRs) are etched in the ground plane of the sensor in a view to be provided with an accumulative notch depth in transmission coefficient. Single and deep notch in transmission coefficient has significant role in efficient measurement of dielectric properties of the materials under test (MUTs). The effective constitutive parameters (permittivity and permeability) of the proposed sensor are retrieved from scattering parameters. The sensitivity analysis is carried out through the proposed sensor by using the standard materials. The parabolic equation for the proposed sensor is formulated to approximate the relative permittivity of the nanoscale materials. Error analysis is performed to determine the accuracy of the proposed sensor. Very small percentage of error, 0.32, is obtained, which shows high accuracy of the proposed sensor. This methodology is very efficient, low cost and easy in fabrication.