HIGH RESOLUTION RADAR GROUND CLUTTER ANALYSIS AT W-BAND

Ning Zhang; Haibo Liu; Yanhua Wang; Liang Zhang; Yang Li

doi:10.1049/icp.2021.0791

HIGH RESOLUTION RADAR GROUND CLUTTER ANALYSIS AT W-BAND

Ning Zhang, Haibo Liu, Yanhua Wang^*, Liang Zhang, Yang Li

^*Corresponding author for this work

School of Information and Electronics

Beijing Institute of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

In this paper, the authors analyse the amplitude distribution of high resolution ground clutter using a W-band radar. Six types of backgrounds are investigated. The goodness-of-fit test is used to determine the probability density function. The results show that the distributions of most backgrounds can be approximated by the Weibull distribution.

Original language	English
Title of host publication	IET Conference Proceedings
Publisher	Institution of Engineering and Technology
Pages	852-857
Number of pages	6
Volume	2020
Edition	9
ISBN (Electronic)	9781839535406
DOIs	https://doi.org/10.1049/icp.2021.0791
Publication status	Published - 2020
Event	5th IET International Radar Conference, IET IRC 2020 - Virtual, Online Duration: 4 Nov 2020 → 6 Nov 2020

Conference

Conference	5th IET International Radar Conference, IET IRC 2020
City	Virtual, Online
Period	4/11/20 → 6/11/20

Keywords

CLUTTER DISTRIBUTION
GOODNESS OF FIT TEST
GROUND CLUTTER
STATISTICAL CHARACTERISTIC

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10.1049/icp.2021.0791

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@inproceedings{9690d677334f4de6aea6d70b1c5e5afe,

title = "HIGH RESOLUTION RADAR GROUND CLUTTER ANALYSIS AT W-BAND",

abstract = "In this paper, the authors analyse the amplitude distribution of high resolution ground clutter using a W-band radar. Six types of backgrounds are investigated. The goodness-of-fit test is used to determine the probability density function. The results show that the distributions of most backgrounds can be approximated by the Weibull distribution.",

keywords = "CLUTTER DISTRIBUTION, GOODNESS OF FIT TEST, GROUND CLUTTER, STATISTICAL CHARACTERISTIC",

author = "Ning Zhang and Haibo Liu and Yanhua Wang and Liang Zhang and Yang Li",

note = "Publisher Copyright: {\textcopyright} 2020 IET Conference Proceedings. All rights reserved.; 5th IET International Radar Conference, IET IRC 2020 ; Conference date: 04-11-2020 Through 06-11-2020",

year = "2020",

doi = "10.1049/icp.2021.0791",

language = "English",

volume = "2020",

pages = "852--857",

booktitle = "IET Conference Proceedings",

publisher = "Institution of Engineering and Technology",

address = "United Kingdom",

edition = "9",

}

TY - GEN

T1 - HIGH RESOLUTION RADAR GROUND CLUTTER ANALYSIS AT W-BAND

AU - Zhang, Ning

AU - Liu, Haibo

AU - Wang, Yanhua

AU - Zhang, Liang

AU - Li, Yang

PY - 2020

Y1 - 2020

N2 - In this paper, the authors analyse the amplitude distribution of high resolution ground clutter using a W-band radar. Six types of backgrounds are investigated. The goodness-of-fit test is used to determine the probability density function. The results show that the distributions of most backgrounds can be approximated by the Weibull distribution.

AB - In this paper, the authors analyse the amplitude distribution of high resolution ground clutter using a W-band radar. Six types of backgrounds are investigated. The goodness-of-fit test is used to determine the probability density function. The results show that the distributions of most backgrounds can be approximated by the Weibull distribution.

KW - CLUTTER DISTRIBUTION

KW - GOODNESS OF FIT TEST

KW - GROUND CLUTTER

KW - STATISTICAL CHARACTERISTIC

UR - http://www.scopus.com/inward/record.url?scp=85174657568&partnerID=8YFLogxK

U2 - 10.1049/icp.2021.0791

DO - 10.1049/icp.2021.0791

M3 - Conference contribution

AN - SCOPUS:85174657568

VL - 2020

SP - 852

EP - 857

BT - IET Conference Proceedings

PB - Institution of Engineering and Technology

T2 - 5th IET International Radar Conference, IET IRC 2020

Y2 - 4 November 2020 through 6 November 2020

ER -

HIGH RESOLUTION RADAR GROUND CLUTTER ANALYSIS AT W-BAND

Abstract

Conference

Keywords

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