High flame retardant and heat-resistance, low dielectric benzoxazine resin with phthalimide structure

Dandan Chen, Benben Liu, Xu Wang, Xiangmei Li*, Xingyan Xu, Jiyu He, Rongjie Yang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

20 Citations (Scopus)

Abstract

In order to improve the thermal stability, flame retardancy and dielectric properties of benzoxazine resin, benzoxazine resins with different content of 4,4′-‍(hexafluoroisopropylidene) diphthalic dianhydride(m-EFDA) were prepared by crosslinking alkynyl groups. The results showed that benzoxazine can improve the processing window of m-EFDA, while m-EFDA was beneficial to improve the thermal stability and dielectric properties of benzoxazine resins. The Td5% of PBZFI-50 reached 418.2°C, Td10% was up to 457.3°C, Dk was 2.89 and Df was as low as 0.013 at 1MHz. The chemical structures of volatile products from the pyrolysis of benzoxazines resin at different temperatures were identified by TG-FTIR and Py-GC/MS, and the promoting effect of m-EFDA on improving the thermal stability was confirmed. Compared with pure benzoxazine resin, the resin containing m-EFDA has great performance improvement, which is expected to be used as high temperature and low dielectric material in aerospace and microelectronics field.

Original languageEnglish
Article number110150
JournalPolymer Degradation and Stability
Volume205
DOIs
Publication statusPublished - Nov 2022

Keywords

  • Degradation
  • Dielectric properties
  • Flame retardancy
  • Phthalimide
  • Polybenzoxazine

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