Abstract
We demonstrate solid-state VCSEL beam scanners integrated with multi-grating pitch tunable seed VCSELs for expanding FOV and scanning resolutions. The total FOV of over 12 and the corresponding resolution points of 166, which could be double in comparison with a single VCSEL beam scanner.
Original language | English |
---|---|
Title of host publication | 2022 28th International Semiconductor Laser Conference, ISLC 2022 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9784885523359 |
DOIs | |
Publication status | Published - 2022 |
Externally published | Yes |
Event | 28th International Semiconductor Laser Conference, ISLC 2022 - Matsue, Japan Duration: 16 Oct 2022 → 19 Oct 2022 |
Publication series
Name | Conference Digest - IEEE International Semiconductor Laser Conference |
---|---|
Volume | 2022-October |
ISSN (Print) | 0899-9406 |
Conference
Conference | 28th International Semiconductor Laser Conference, ISLC 2022 |
---|---|
Country/Territory | Japan |
City | Matsue |
Period | 16/10/22 → 19/10/22 |
Fingerprint
Dive into the research topics of 'Expanding Field of View of Solid-state VCSEL Beam Scanner with Multi-wavelength Seed VCSELs'. Together they form a unique fingerprint.Cite this
Kanja, S., Hu, S., Gu, X., & Koyama, F. (2022). Expanding Field of View of Solid-state VCSEL Beam Scanner with Multi-wavelength Seed VCSELs. In 2022 28th International Semiconductor Laser Conference, ISLC 2022 (Conference Digest - IEEE International Semiconductor Laser Conference; Vol. 2022-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/ISLC52947.2022.9943450