Expanding Field of View of Solid-state VCSEL Beam Scanner with Multi-wavelength Seed VCSELs

Shunsuke Kanja*, Shanting Hu, Xiaodong Gu, Fumio Koyama

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate solid-state VCSEL beam scanners integrated with multi-grating pitch tunable seed VCSELs for expanding FOV and scanning resolutions. The total FOV of over 12 and the corresponding resolution points of 166, which could be double in comparison with a single VCSEL beam scanner.

Original languageEnglish
Title of host publication2022 28th International Semiconductor Laser Conference, ISLC 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784885523359
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event28th International Semiconductor Laser Conference, ISLC 2022 - Matsue, Japan
Duration: 16 Oct 202219 Oct 2022

Publication series

NameConference Digest - IEEE International Semiconductor Laser Conference
Volume2022-October
ISSN (Print)0899-9406

Conference

Conference28th International Semiconductor Laser Conference, ISLC 2022
Country/TerritoryJapan
CityMatsue
Period16/10/2219/10/22

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