Exact reliability of a linear connected-(r,s)-out-of-(m,n): F system

Xian Zhao*, Lirong Cui, Wei Zhao, Fen Liu

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    26 Citations (Scopus)

    Abstract

    A linear connected-(r,s) -out-of-(m,n):F system consists of m × n components arranged in m rows by n columns, and it fails iff there exists a r × s subsystem in which all components are failed. The linear connected-(r,s)-out-of-(m,n):F system can be used for modeling engineering systems such as temperature feeler systems, supervision systems, etc. In this paper, a general method is proposed based on the finite Markov chain imbedding approach to study the exact reliability of a linear connected-(r,s)-out-of-(m,n) :F system. Then a new more efficient method, which reduces the size of the state space by combining some states into one state, is presented to reduce the computing time. Furthermore, three numerical examples are given. The first two numerical examples show that the proposed algorithm is efficient not only when the component states are i.i.d., but also when the component states are statistically independent and non-identically distributed. And the last numerical example shows that our method can be used to compute not only the reliability, but also the component importance.

    Original languageEnglish
    Article number5762383
    Pages (from-to)689-698
    Number of pages10
    JournalIEEE Transactions on Reliability
    Volume60
    Issue number3
    DOIs
    Publication statusPublished - Sept 2011

    Keywords

    • Finite Markov chain imbedding approach
    • scan statistic
    • two-dimension systems

    Fingerprint

    Dive into the research topics of 'Exact reliability of a linear connected-(r,s)-out-of-(m,n): F system'. Together they form a unique fingerprint.

    Cite this