Elimination of Critical Geometric Features of Radar Imaging by Arranging Corner Reflector Array

Jiaming Li*, Xinhui Zhang, Xiuzhu Ye

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, a design method is proposed to improve target stealth ability. Firstly, the geometric contour of the target is imaged using the Omega-K algorithm. Secondly, the typical geometric features can be eliminated by arranging corner reflector array. Finally, numerical simulation results are provided to verify the effectiveness of the proposed method.

Original languageEnglish
Title of host publication2023 IEEE International Workshop on Electromagnetics
Subtitle of host publicationApplications and Student Innovation Competition, iWEM 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages421-422
Number of pages2
ISBN (Electronic)9798350336740
DOIs
Publication statusPublished - 2023
Event2023 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2023 - Harbin, China
Duration: 15 Jul 202318 Jul 2023

Publication series

Name2023 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2023

Conference

Conference2023 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2023
Country/TerritoryChina
CityHarbin
Period15/07/2318/07/23

Keywords

  • Omega-K algorithm
  • corner reflector array
  • target stealth
  • typical geometric feature

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Cite this

Li, J., Zhang, X., & Ye, X. (2023). Elimination of Critical Geometric Features of Radar Imaging by Arranging Corner Reflector Array. In 2023 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2023 (pp. 421-422). (2023 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition, iWEM 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/iWEM58222.2023.10234922