Electronic and transport properties of a biased multilayer hexagonal boron nitride

K. Tang*, Z. Y. Ni, Q. H. Liu, R. G. Quhe, Q. Y. Zheng, J. X. Zheng, R. X. Fei, Z. X. Gao, J. Lu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

We explore the electronic and transport properties out of a biased multilayer hexagonal boron nitride (h-BN) by first-principles calculations. The band gaps of multilayer h-BN decrease almost linearly with increasing perpendicular electric field, irrespective of the layer number N and stacking manner. The critical electric filed (E0) required to close the band gap decreases with the increasing N and can be approximated by E0 = 3.2/(N-1) (eV). We provide a quantum transport simulation of a dual-gated 4-layer h-BN with graphene electrodes. The transmission gap in this device can be effectively reduced by double gates, and a high on-off ratio of 3000 is obtained with relatively low voltage. This renders biased MLh-BN a promising channel in field effect transistor fabrication.

Original languageEnglish
Article number301
JournalEuropean Physical Journal B
Volume85
Issue number9
DOIs
Publication statusPublished - Sept 2012
Externally publishedYes

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