Edge extraction of optical subaperture based on fractal dimension method

Yunqi Wang, Mei Hui*, Ming Liu, Liquan Dong, Xiaohua Liu, Yuejin Zhao

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Optical synthetic aperture imaging technology is an effective approach to increase the aperture diameter of optical system for purpose of improving resolution. In optical synthetic aperture imaging system, the edge is more complex than that of traditional optical imaging system, and the relatively large size of the gaps between the subapertures makes cophasing a difficult problem. So it is significant to extract edge phase of each subaperture for achieving phase stitching and avoiding the loss of effective frequency. Fractal dimension as a measure feature of image surface irregularities can statistically evaluate the complexity which is consistent with human visual image perception of rough surface texture. Therefore, fractal dimension provides a powerful tool to describe surface characteristics of image and can be applied to edge extraction. In our research, the box-counting dimension was used to calculate fractal dimension of the whole image. Then the calculated fractal dimension is mapped to grayscale image. The region with large fractal dimension represents a sharper change of the gray scale in original image, which was accurately extracted as the edge region. Subaperture region and interference fringe edge was extracted from interference pattern of optical subaperture, which has laid the foundation for the subaperture edge phase detection in the future work.

Original languageEnglish
Title of host publicationOptics and Photonics for Information Processing IX
EditorsMohammad A. Matin, Abdul A. S. Awwal, Andres Marquez, Mireya Garcia Vazquez, Khan M. Iftekharuddin, Mireya Garcia Vazquez, Khan M. Iftekharuddin, Abdul A. S. Awwal, Mohammad A. Matin, Andres Marquez
PublisherSPIE
ISBN (Electronic)9781628417647, 9781628417647
DOIs
Publication statusPublished - 2015
Event9th Conference of Optics and Photonics for Information Processing - San Diego, United States
Duration: 10 Aug 201512 Aug 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9598
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference9th Conference of Optics and Photonics for Information Processing
Country/TerritoryUnited States
CitySan Diego
Period10/08/1512/08/15

Keywords

  • Box-counting dimension
  • Edge extraction
  • Fractal dimension
  • Subaperture

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