Distance measurement for rotation center to measurement table using triangulation method

Xicheng Wang, Muzheng Xiao*, Chao Wang, Xin Jin, Zhijing Zhang, Kiyoshi Takamasu

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Large aspheric mirrors with diameter over 200 mm are widely used in space communication system, large-scale astronomical telescope and X-ray facilities. However the measurement of these mirrors with large slope is a long-term problem. Scanning deflectometry method using autocollimator with rotary stage was proposed for measuring mirrors with large slope. The repeatability of the method has been confirmed as tens of nanometers. However, the absolute accuracy of the method is not confirmed since the distance between the rotation center of the rotary stage and the mirror under measurement is difficult to measure, which strongly affects the measurement accuracy of scanning deflectometry method. In this paper, we have proposed a triangulation method with CMOS sensor for measuring the distance from the rotation center to the measurement table (marble surface). The error analysis shows that the measurement uncertainty of this measurement method is about 40 microns. The repeated experiments show that the measurement accuracy of the proposed method is 49.7 microns, which meets the requirements of large mirror measurement with tens of nanometers' uncertainty. This method also provides a new solution for the position measurement of the rotation center of the large scale rotary device.

Original languageEnglish
Title of host publicationSelected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016
EditorsHesheng Chen, Jianyu Wang, Jialing Le, Jianda Shao, Yueguang Lv
PublisherSPIE
ISBN (Electronic)9781510610118
DOIs
Publication statusPublished - 2017
EventChinese Society for Optical Engineering Conferences, CSOE 2016 - Jinhua, Suzhou, Chengdu, Xi'an, and Wuxi, China
Duration: 1 Nov 2016 → …

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10255
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceChinese Society for Optical Engineering Conferences, CSOE 2016
Country/TerritoryChina
CityJinhua, Suzhou, Chengdu, Xi'an, and Wuxi
Period1/11/16 → …

Keywords

  • Nanometer precision surface measurement
  • Random error analysis
  • Scanning deflectometry
  • Triangulation method

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