Tian, H., Ma, Y., Li, Z., Cheng, M., Ning, S., Han, E., Xu, M., Zhang, P. F., Zhao, K., Li, R., Zou, Y., Liao, P. C., Yu, S., Li, X., Wang, J., Liu, S., Li, Y., Huang, X., Yao, Z., ... Liu, L. (2023). Disorder-tuned conductivity in amorphous monolayer carbon. Nature, 615(7950), 56-61. https://doi.org/10.1038/s41586-022-05617-w
@article{a7291c8c47c2401789b72816963f3965,
title = "Disorder-tuned conductivity in amorphous monolayer carbon",
abstract = "Correlating atomic configurations—specifically, degree of disorder (DOD)—of an amorphous solid with properties is a long-standing riddle in materials science and condensed matter physics, owing to difficulties in determining precise atomic positions in 3D structures1–5. To this end, 2D systems provide insight to the puzzle by allowing straightforward imaging of all atoms6,7. Direct imaging of amorphous monolayer carbon (AMC) grown by laser-assisted depositions has resolved atomic configurations, supporting the modern crystallite view of vitreous solids over random network theory8. Nevertheless, a causal link between atomic-scale structures and macroscopic properties remains elusive. Here we report facile tuning of DOD and electrical conductivity in AMC films by varying growth temperatures. Specifically, the pyrolysis threshold temperature is the key to growing variable-range-hopping conductive AMC with medium-range order (MRO), whereas increasing the temperature by 25 °C results in AMC losing MRO and becoming electrically insulating, with an increase in sheet resistance of 109 times. Beyond visualizing highly distorted nanocrystallites embedded in a continuous random network, atomic-resolution electron microscopy shows the absence/presence of MRO and temperature-dependent densities of nanocrystallites, two order parameters proposed to fully describe DOD. Numerical calculations establish the conductivity diagram as a function of these two parameters, directly linking microstructures to electrical properties. Our work represents an important step towards understanding the structure–property relationship of amorphous materials at the fundamental level and paves the way to electronic devices using 2D amorphous materials.",
author = "Huifeng Tian and Yinhang Ma and Zhenjiang Li and Mouyang Cheng and Shoucong Ning and Erxun Han and Mingquan Xu and Zhang, {Peng Fei} and Kexiang Zhao and Ruijie Li and Yuting Zou and Liao, {Pei Chi} and Shulei Yu and Xiaomei Li and Jianlin Wang and Shizhuo Liu and Yifei Li and Xinyu Huang and Zhixin Yao and Dongdong Ding and Junjie Guo and Yuan Huang and Jianming Lu and Yuyan Han and Zhaosheng Wang and Cheng, {Zhi Gang} and Junjiang Liu and Zhi Xu and Kaihui Liu and Peng Gao and Ying Jiang and Li Lin and Xiaoxu Zhao and Lifen Wang and Xuedong Bai and Wangyang Fu and Wang, {Jie Yu} and Maozhi Li and Ting Lei and Yanfeng Zhang and Yanglong Hou and Jian Pei and Pennycook, {Stephen J.} and Enge Wang and Ji Chen and Wu Zhou and Lei Liu",
note = "Publisher Copyright: {\textcopyright} 2023, The Author(s), under exclusive licence to Springer Nature Limited.",
year = "2023",
month = mar,
day = "2",
doi = "10.1038/s41586-022-05617-w",
language = "English",
volume = "615",
pages = "56--61",
journal = "Nature",
issn = "0028-0836",
publisher = "Nature Research",
number = "7950",
}
Tian, H, Ma, Y, Li, Z, Cheng, M, Ning, S, Han, E, Xu, M, Zhang, PF, Zhao, K, Li, R, Zou, Y, Liao, PC, Yu, S, Li, X, Wang, J, Liu, S, Li, Y, Huang, X, Yao, Z, Ding, D, Guo, J, Huang, Y, Lu, J, Han, Y, Wang, Z, Cheng, ZG, Liu, J, Xu, Z, Liu, K, Gao, P, Jiang, Y, Lin, L, Zhao, X, Wang, L, Bai, X, Fu, W, Wang, JY, Li, M, Lei, T, Zhang, Y, Hou, Y, Pei, J, Pennycook, SJ, Wang, E, Chen, J, Zhou, W & Liu, L 2023, 'Disorder-tuned conductivity in amorphous monolayer carbon', Nature, vol. 615, no. 7950, pp. 56-61. https://doi.org/10.1038/s41586-022-05617-w
TY - JOUR
T1 - Disorder-tuned conductivity in amorphous monolayer carbon
AU - Tian, Huifeng
AU - Ma, Yinhang
AU - Li, Zhenjiang
AU - Cheng, Mouyang
AU - Ning, Shoucong
AU - Han, Erxun
AU - Xu, Mingquan
AU - Zhang, Peng Fei
AU - Zhao, Kexiang
AU - Li, Ruijie
AU - Zou, Yuting
AU - Liao, Pei Chi
AU - Yu, Shulei
AU - Li, Xiaomei
AU - Wang, Jianlin
AU - Liu, Shizhuo
AU - Li, Yifei
AU - Huang, Xinyu
AU - Yao, Zhixin
AU - Ding, Dongdong
AU - Guo, Junjie
AU - Huang, Yuan
AU - Lu, Jianming
AU - Han, Yuyan
AU - Wang, Zhaosheng
AU - Cheng, Zhi Gang
AU - Liu, Junjiang
AU - Xu, Zhi
AU - Liu, Kaihui
AU - Gao, Peng
AU - Jiang, Ying
AU - Lin, Li
AU - Zhao, Xiaoxu
AU - Wang, Lifen
AU - Bai, Xuedong
AU - Fu, Wangyang
AU - Wang, Jie Yu
AU - Li, Maozhi
AU - Lei, Ting
AU - Zhang, Yanfeng
AU - Hou, Yanglong
AU - Pei, Jian
AU - Pennycook, Stephen J.
AU - Wang, Enge
AU - Chen, Ji
AU - Zhou, Wu
AU - Liu, Lei
N1 - Publisher Copyright:
© 2023, The Author(s), under exclusive licence to Springer Nature Limited.
PY - 2023/3/2
Y1 - 2023/3/2
N2 - Correlating atomic configurations—specifically, degree of disorder (DOD)—of an amorphous solid with properties is a long-standing riddle in materials science and condensed matter physics, owing to difficulties in determining precise atomic positions in 3D structures1–5. To this end, 2D systems provide insight to the puzzle by allowing straightforward imaging of all atoms6,7. Direct imaging of amorphous monolayer carbon (AMC) grown by laser-assisted depositions has resolved atomic configurations, supporting the modern crystallite view of vitreous solids over random network theory8. Nevertheless, a causal link between atomic-scale structures and macroscopic properties remains elusive. Here we report facile tuning of DOD and electrical conductivity in AMC films by varying growth temperatures. Specifically, the pyrolysis threshold temperature is the key to growing variable-range-hopping conductive AMC with medium-range order (MRO), whereas increasing the temperature by 25 °C results in AMC losing MRO and becoming electrically insulating, with an increase in sheet resistance of 109 times. Beyond visualizing highly distorted nanocrystallites embedded in a continuous random network, atomic-resolution electron microscopy shows the absence/presence of MRO and temperature-dependent densities of nanocrystallites, two order parameters proposed to fully describe DOD. Numerical calculations establish the conductivity diagram as a function of these two parameters, directly linking microstructures to electrical properties. Our work represents an important step towards understanding the structure–property relationship of amorphous materials at the fundamental level and paves the way to electronic devices using 2D amorphous materials.
AB - Correlating atomic configurations—specifically, degree of disorder (DOD)—of an amorphous solid with properties is a long-standing riddle in materials science and condensed matter physics, owing to difficulties in determining precise atomic positions in 3D structures1–5. To this end, 2D systems provide insight to the puzzle by allowing straightforward imaging of all atoms6,7. Direct imaging of amorphous monolayer carbon (AMC) grown by laser-assisted depositions has resolved atomic configurations, supporting the modern crystallite view of vitreous solids over random network theory8. Nevertheless, a causal link between atomic-scale structures and macroscopic properties remains elusive. Here we report facile tuning of DOD and electrical conductivity in AMC films by varying growth temperatures. Specifically, the pyrolysis threshold temperature is the key to growing variable-range-hopping conductive AMC with medium-range order (MRO), whereas increasing the temperature by 25 °C results in AMC losing MRO and becoming electrically insulating, with an increase in sheet resistance of 109 times. Beyond visualizing highly distorted nanocrystallites embedded in a continuous random network, atomic-resolution electron microscopy shows the absence/presence of MRO and temperature-dependent densities of nanocrystallites, two order parameters proposed to fully describe DOD. Numerical calculations establish the conductivity diagram as a function of these two parameters, directly linking microstructures to electrical properties. Our work represents an important step towards understanding the structure–property relationship of amorphous materials at the fundamental level and paves the way to electronic devices using 2D amorphous materials.
UR - http://www.scopus.com/inward/record.url?scp=85149427246&partnerID=8YFLogxK
U2 - 10.1038/s41586-022-05617-w
DO - 10.1038/s41586-022-05617-w
M3 - Article
C2 - 36859579
AN - SCOPUS:85149427246
SN - 0028-0836
VL - 615
SP - 56
EP - 61
JO - Nature
JF - Nature
IS - 7950
ER -