Discrete impurity band from surface danging bonds in nitrogen and phosphorus doped SiC nanowires

Yan Jing Li, Shu Long Li, Pei Gong, Ya Lin Li, Mao Sheng Cao, Xiao Yong Fang*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

The electronic structure and optical properties of the nitrogen and phosphorus doped silicon carbide nanowires (SiCNWs) are investigated using first-principle calculations based on density functional theory. The results show doping can change the type of the band gap and improve the conductivity. However, the doped SiCNWs form a discrete impurity levels at the Fermi energy, and the dispersion degree decreases with the diameter increasing. In order to reveal the root of this phenomenon, we hydrogenated the doped SiCNWs, found that the surface dangling bonds were saturated, and the discrete impurity levels are degeneracy, which indicates that the discrete impurity band of the doped SiCNWs is derived from the dangling bonds. The surface passivation can degenerate the impurity levels. Therefore, both doping and surface passivation can better improve the photoelectric properties of the SiCNWs. The result can provide additional candidates in producing nano-optoelectronic devices.

Original languageEnglish
Pages (from-to)191-196
Number of pages6
JournalPhysica E: Low-Dimensional Systems and Nanostructures
Volume98
DOIs
Publication statusPublished - Apr 2018

Keywords

  • Electronic and optical properties
  • Hydrogen passivation
  • Nitrogen and phosphorus doped
  • Silicon carbon nanowires
  • Surface danging bonds

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