Development of a practical scanning acoustic microscopy

Zhongzhu Liu*, Chunguang Xu, Xinyu Zhao, Xianghui Guo

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

5 Citations (Scopus)

Abstract

Scanning acoustic microscopy (SAM) is a powerful non-destructive testing tool used in electronic, material and medical testing area. Commercial SAM products are generally too expensive to be extended to common users. Therefore, a practical SAM system had been developed using high-frequency ultrasonic focus transducers, a wide-band pulse transmitter/receiver, a high-speed data acquisition card, and a high-precision motion system. The SAM system's precision and function can meet the requirement of practical test adequately, and the cost is much lower compared to commercial products. Several kinds of imaging method were introduced, and the SAM system has the ability to accomplish full-wave data acquisition.

Original languageEnglish
Pages (from-to)1128-1131
Number of pages4
JournalAdvanced Materials Research
Volume468-471
DOIs
Publication statusPublished - 2012
Event3rd international Conference on Manufacturing Science and Engineering, ICMSE 2012 - Xiamen, China
Duration: 27 Mar 201229 Mar 2012

Keywords

  • Full-wave acquisition
  • Non-destructive testing
  • Scanning acoustic microscopy

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