Abstract
Scanning acoustic microscopy (SAM) is a powerful non-destructive testing tool used in electronic, material and medical testing area. Commercial SAM products are generally too expensive to be extended to common users. Therefore, a practical SAM system had been developed using high-frequency ultrasonic focus transducers, a wide-band pulse transmitter/receiver, a high-speed data acquisition card, and a high-precision motion system. The SAM system's precision and function can meet the requirement of practical test adequately, and the cost is much lower compared to commercial products. Several kinds of imaging method were introduced, and the SAM system has the ability to accomplish full-wave data acquisition.
Original language | English |
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Pages (from-to) | 1128-1131 |
Number of pages | 4 |
Journal | Advanced Materials Research |
Volume | 468-471 |
DOIs | |
Publication status | Published - 2012 |
Event | 3rd international Conference on Manufacturing Science and Engineering, ICMSE 2012 - Xiamen, China Duration: 27 Mar 2012 → 29 Mar 2012 |
Keywords
- Full-wave acquisition
- Non-destructive testing
- Scanning acoustic microscopy