Design of 0.2μm GATE-LENGTH ALGAN/GAN HEMTS BY SIMULATION

Xiaobin Luo, Weihua Yu, Xin Lv

Research output: Contribution to journalArticlepeer-review

Abstract

A device of 0.2μm gate-length and 50μm gate-width AlGaN/GaN HEMTs is designed through the semiconductor software while DC and RF characteristics are simulated in the paper. The device structure is described and analyzed. The relevant material parameters and physical models are both determined. The output current curves and transfer curves are both obtained at different Vgs and Vds. They show excellent electrical properties at static operating condition. The breakdown voltage and junction temperature are analyzed so that the DC bias point can be determined. High frequency characteristics are achieved by RF small signal and large signal simulation. The results indicate that the paper can provide a scheme for designing AlGaN/GaN HEMTs which can be applied to millimeter-wave band.

Original languageEnglish
Pages (from-to)2813-2818
Number of pages6
JournalICIC Express Letters
Volume8
Issue number10
Publication statusPublished - 2014

Keywords

  • AlGaN/GaN
  • Breakdown voltage
  • HEMT
  • Junction temperature
  • Millimeter-wave band

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