Abstract
We characterize an attosecond pulse without using a secondary laser pulse. Instead, we use the carrier-envelope-phase dependence of the extreme ultraviolet (XUV) emission to measure the dipole current from a solid material. To confirm, we apply our approach to data derived by solving the time-dependent Schrödinger equation with a periodic potential. Finally, using MgO, we measure the delay shift at the strong XUV absorption feature and explain it as the quantum interference between the continuum and bound states that participate in the generation process.
Original language | English |
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Article number | 124001 |
Journal | Journal of Physics B: Atomic, Molecular and Optical Physics |
Volume | 53 |
Issue number | 12 |
DOIs | |
Publication status | Published - 28 Jun 2020 |
Externally published | Yes |
Keywords
- attosecond pulse measurement
- delay in recollision process
- strong-field physics