Delay measurement of attosecond emission in solids

Dong Hyuk Ko, Graham G. Brown, Chunmei Zhang, P. B. Corkum*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

We characterize an attosecond pulse without using a secondary laser pulse. Instead, we use the carrier-envelope-phase dependence of the extreme ultraviolet (XUV) emission to measure the dipole current from a solid material. To confirm, we apply our approach to data derived by solving the time-dependent Schrödinger equation with a periodic potential. Finally, using MgO, we measure the delay shift at the strong XUV absorption feature and explain it as the quantum interference between the continuum and bound states that participate in the generation process.

Original languageEnglish
Article number124001
JournalJournal of Physics B: Atomic, Molecular and Optical Physics
Volume53
Issue number12
DOIs
Publication statusPublished - 28 Jun 2020
Externally publishedYes

Keywords

  • attosecond pulse measurement
  • delay in recollision process
  • strong-field physics

Fingerprint

Dive into the research topics of 'Delay measurement of attosecond emission in solids'. Together they form a unique fingerprint.

Cite this