Correlation Feature Mining Model Based on Dual Attention for Feature Envy Detection

Shuxin Zhao, Chongyang Shi*, Shaojun Ren, Hufsa Mohsin

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

Feature Envy is a code smell due to the abnormal calling relationships between methods and classes, which adversely affects software scalability and maintainability. Existing methods mainly use various technologies to model abnormal relationships to detect feature envy. However, these methods only rely on local features such as entity names, which is not robust enough. Moreover, the mining depth of correlation features between entities involved in feature envy is limited. In this paper, we propose a correlation feature mining model based on dual attention to detect feature envy. Firstly, we propose a multi-view-based entity representation strategy, which enhanced the robustness of the model while improving the suitability of the correlation feature and model. Secondly, we add attention mechanism to the channel dimension and spatial dimension of CNN to control the flow of information and capture the correlation features between entities more accurately. Finally, the evaluation results on projects both with and without feature envy injected show that our proposed approach outperforms the state-of-the-art methods.

Original languageEnglish
Title of host publicationSEKE 2022 - Proceedings of the 34th International Conference on Software Engineering and Knowledge Engineering
PublisherKnowledge Systems Institute Graduate School
Pages634-639
Number of pages6
ISBN (Electronic)1891706543, 9781891706547
DOIs
Publication statusPublished - 2022
Event34th International Conference on Software Engineering and Knowledge Engineering, SEKE 2022 - Pittsburgh, United States
Duration: 1 Jul 202210 Jul 2022

Publication series

NameProceedings of the International Conference on Software Engineering and Knowledge Engineering, SEKE
ISSN (Print)2325-9000
ISSN (Electronic)2325-9086

Conference

Conference34th International Conference on Software Engineering and Knowledge Engineering, SEKE 2022
Country/TerritoryUnited States
CityPittsburgh
Period1/07/2210/07/22

Keywords

  • Attention Mechanism
  • Code Smell
  • Deep Learning
  • Feature Envy
  • Software Refactoring

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