TY - JOUR
T1 - Component distribution of nano-carbon materials assisted by time of flight-secondary ion mass spectrometer
AU - Dong, Ying
AU - Xu, Fan
AU - Li, Yan
AU - Song, Tinglu
AU - Tan, Guoqiang
N1 - Publisher Copyright:
© 2021 Institute of Physics Publishing. All rights reserved.
PY - 2021/9/8
Y1 - 2021/9/8
N2 - Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.
AB - Currently, there exist various materials surface analysis and characterization techniques, but it is difficult to measure their component distribution, in particular from a three-dimensional prospect. In this paper, the component distribution of nano-carbon materials in 2D and 3D views were both characterized via Time of Flight-Secondary Ion Mass Spectrometer (TOF-SIMS). The results indicate that TOF-SIMS could provide comprehensive information about component distribution, which is expected to be developed as an advanced technology in material analysis and characterization to the research community.
UR - http://www.scopus.com/inward/record.url?scp=85115053645&partnerID=8YFLogxK
U2 - 10.1088/1742-6596/2011/1/012071
DO - 10.1088/1742-6596/2011/1/012071
M3 - Conference article
AN - SCOPUS:85115053645
SN - 1742-6588
VL - 2011
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012071
T2 - 2021 5th International Conference on Green Composite Materials and Nanotechnology, GCMN 2021
Y2 - 23 July 2021 through 25 July 2021
ER -