TY - JOUR
T1 - Author Correction
T2 - Rugged bialkali photocathodes encapsulated with graphene and thin metal film (Scientific Reports, (2023), 13, 1, (2412), 10.1038/s41598-023-29374-6)
AU - Guo, Lei
AU - Liu, Fangze
AU - Koyama, Kazuki
AU - Regis, Nolan
AU - Alexander, Anna M.
AU - Wang, Gaoxue
AU - DeFazio, Jeffrey
AU - Valdez, James A.
AU - Poudel, Anju
AU - Yamamoto, Masahiro
AU - Moody, Nathan A.
AU - Takashima, Yoshifumi
AU - Yamaguchi, Hisato
N1 - Publisher Copyright:
© 2023 The Author(s).
PY - 2023/12
Y1 - 2023/12
N2 - The original version of this Article contained errors. The Article contained an error in Affiliation 6, which was incorrectly given as ‘Accelerator Division 6, High Energy Accelerator Research Organization (KEK), 1‑1 Oho, Tsukuba, Ibaraki 305‑0801, Japan’. The correct affiliation is listed below: Innovation Center for Applied Superconducting Accelerators, High Energy Accelerator Research Organization (KEK), 1‑1 Oho, Tsukuba, Ibaraki 305‑0801, Japan Additionally, the Article contained an error in Results and discussion section, under ‘Selection of the sealing metal’ subheading, “In our previous study, synchrotron X-ray photoelectron spectroscopy (XPS) revealed that there was residual photocathode material on Si and Mo substrates even after the thermal cleaning, indicating that there was strong bonding/alloying between the photocathode and the substrates.”.
AB - The original version of this Article contained errors. The Article contained an error in Affiliation 6, which was incorrectly given as ‘Accelerator Division 6, High Energy Accelerator Research Organization (KEK), 1‑1 Oho, Tsukuba, Ibaraki 305‑0801, Japan’. The correct affiliation is listed below: Innovation Center for Applied Superconducting Accelerators, High Energy Accelerator Research Organization (KEK), 1‑1 Oho, Tsukuba, Ibaraki 305‑0801, Japan Additionally, the Article contained an error in Results and discussion section, under ‘Selection of the sealing metal’ subheading, “In our previous study, synchrotron X-ray photoelectron spectroscopy (XPS) revealed that there was residual photocathode material on Si and Mo substrates even after the thermal cleaning, indicating that there was strong bonding/alloying between the photocathode and the substrates.”.
UR - http://www.scopus.com/inward/record.url?scp=85149307395&partnerID=8YFLogxK
U2 - 10.1038/s41598-023-30799-2
DO - 10.1038/s41598-023-30799-2
M3 - Comment/debate
C2 - 36864177
AN - SCOPUS:85149307395
SN - 2045-2322
VL - 13
JO - Scientific Reports
JF - Scientific Reports
IS - 1
M1 - 3554
ER -