Artificial Neural Network Modeling of Microwave Sensors for Dielectric Liquids Characterization

Giovanni Gugliandolo, Zlatica Marinković, Xiue Bao, Cristiano De Marchis, Filippo Battaglia, Mariangela Latino, Giuseppe Campobello, Giovanni Crupi, Nicola Donato

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

The aim of this study is to develop a modeling procedure based on using artificial neural networks (ANNs) for predicting the frequency-dependent behavior of a microwave split-ring resonator (SRR) used for the dielectric characterization of liquid samples. The SRR device was designed and fabricated using the inkjet printing technology and, then, calibrated by means of water/ethanol mixtures with varying concentrations. By observing the variations in the forward transmission coefficient (i.e., S21) of the studied microwave device, a frequency shift of the resonant frequency and variations in the magnitude of S21 were recorded, which were related to the ethanol volume fraction. Using this calibration data, an ANN-based model is developed, which takes the ethanol volume fraction as input feature and, then, predicts the SRR sensor resonant parameters. The accuracy of the ANN-based model is reported and discussed.

Original languageEnglish
Title of host publication2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages401-405
Number of pages5
ISBN (Electronic)9798350300802
DOIs
Publication statusPublished - 2023
Event2nd Edition IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Milano, Italy
Duration: 25 Oct 202327 Oct 2023

Publication series

Name2023 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023 - Proceedings

Conference

Conference2nd Edition IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering, MetroXRAINE 2023
Country/TerritoryItaly
CityMilano
Period25/10/2327/10/23

Keywords

  • ANN
  • SRR
  • biological materials
  • dielectric characterization
  • liquids
  • microwave sensors
  • scattering parameter measurements

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