Application of guard traces with vias in the RF PCB layout

Zhi Li, Qiang Wang, Changsheng Shi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

48 Citations (Scopus)

Abstract

In this paper we discuss the affection of the guard traces(shown in Figure 3) with vias to the function of the parallel double micro-strip lines in the PCB layout, the structure of the parallel double micro-strip line is treated as a symmetrical network with 4 ports, simulation on the S parameters is processed, from the S parameters we can analyze the effect of the guard trace, then get the conclusion that the guard trace with vias is helpful to decrease the coupling strength between the double micro-strip lines.

Original languageEnglish
Title of host publication2002 3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002
EditorsYinghong Wen, Linchang Zhang
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages771-774
Number of pages4
ISBN (Electronic)0780372778
DOIs
Publication statusPublished - 2002
Externally publishedYes
Event3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002 - Beijing, China
Duration: 21 May 200224 May 2002

Publication series

NameIEEE International Symposium on Electromagnetic Compatibility
Volume2002-January
ISSN (Print)1077-4076
ISSN (Electronic)2158-1118

Conference

Conference3rd International Symposium on Electromagnetic CompatibiIity, EMC 2002
Country/TerritoryChina
CityBeijing
Period21/05/0224/05/02

Keywords

  • Couple
  • Guard trace
  • RF PCB vias micro-strip line standing wave
  • Waveguide

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