Analysis of the Influence of Polarization Measurement Errors on the Parameter and Characteristics Measurement of the Fully Polarized Entomological Radar

Muyang Li, Teng Yu, Rui Wang*, Weidong Li, Fan Zhang, Chunfeng Wu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Measuring the orientation, mass and body length of migratory insects through entomological radar is crucial for early warnings of migratory pests. The fully polarized entomological radar is an efficient device for observing migratory insects by calculating insect parameters through the scattering matrix obtained from the target. However, the measured target scattering matrix will be affected by system polarization measurement errors, leading to errors in insect parameter calculation, while the related analysis is currently relatively limited. Therefore, the scattering matrix measurement process is modeled, followed by an analysis of the effects of different errors on orientation, mass and body length estimation. The influence of polarization measurement errors on insect scattering characteristics is also analyzed. The results present that for fixed polarization measurement errors, the measurement errors of insect orientation, mass and body length will vary with insect orientation in specific patterns, and the distribution of measured insect parameters will be drastically distorted compared to the true parameter distribution. In addition, polarization measurement errors could seriously disrupt the reciprocity and bilateral symmetry of the measured insect scattering matrix. These analyses and conclusions provide a good basis for eliminating the effects of polarization measurement errors and improving the accuracy of insect parameter measurement.

Original languageEnglish
Article number1220
JournalRemote Sensing
Volume16
Issue number7
DOIs
Publication statusPublished - Apr 2024

Keywords

  • entomological radar
  • insect parameter estimation
  • polarization measurement errors
  • polarization scattering characteristics

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