Abstract
In this study, we propose an edge detection scheme based on Fourier single-pixel imaging, which extracts edges directly from the Fourier spectrum of the target object. The numerical simulations and experimental results show that the edges extracted by the proposed scheme have a better signal-to-noise ratio (SNR) than those extracted by the phase-shift sinusoidal pattern scheme. Furthermore, we investigate the effect of edge extraction in the case of undersampling and propose a plug-and-play edge detection algorithm to enhance the image. Our work combines Fourier single-pixel imaging with edge detection to extract the edges of a target object without imaging, providing a new idea for edge detection techniques.
Original language | English |
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Article number | 107828 |
Journal | Optics and Lasers in Engineering |
Volume | 172 |
DOIs | |
Publication status | Published - Jan 2024 |
Keywords
- Edge detection
- Enhanced algorithm
- Single-pixel imaging (SPI)