Ablated transformation and dielectric of SiO2/SiO2 nanocomposites dipped with silicon resin

Mao Sheng Cao; Hai Bo Jin; Jin Gang Li; Liang Zhang; Qiang Xu; Xiang Li; Lan Tian Xiong

doi:10.4028/0-87849-410-3.1239

Ablated transformation and dielectric of SiO₂/SiO₂ nanocomposites dipped with silicon resin

Mao Sheng Cao^*, Hai Bo Jin, Jin Gang Li, Liang Zhang, Qiang Xu, Xiang Li, Lan Tian Xiong

^*Corresponding author for this work

School of Material Science and Engineering

Beijing Institute of Technology

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

SiO₂/ SiO₂ nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties.

Original language	English
Pages (from-to)	1239-1241
Number of pages	3
Journal	Key Engineering Materials
Volume	336-338 II
DOIs	https://doi.org/10.4028/0-87849-410-3.1239
Publication status	Published - 2007

Keywords

Ablation
High-temperature dielectric properties
Silicon dioxide
Transformation

Access to Document

10.4028/0-87849-410-3.1239

Cite this

@article{1594e21ccf1d42e8b8cda0916fc9909d,

title = "Ablated transformation and dielectric of SiO2/SiO2 nanocomposites dipped with silicon resin",

abstract = "SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties.",

keywords = "Ablation, High-temperature dielectric properties, Silicon dioxide, Transformation",

author = "Cao, {Mao Sheng} and Jin, {Hai Bo} and Li, {Jin Gang} and Liang Zhang and Qiang Xu and Xiang Li and Xiong, {Lan Tian}",

year = "2007",

doi = "10.4028/0-87849-410-3.1239",

language = "English",

volume = "336-338 II",

pages = "1239--1241",

journal = "Key Engineering Materials",

issn = "1013-9826",

publisher = "Trans Tech Publications",

}

TY - JOUR

T1 - Ablated transformation and dielectric of SiO2/SiO2 nanocomposites dipped with silicon resin

AU - Cao, Mao Sheng

AU - Jin, Hai Bo

AU - Li, Jin Gang

AU - Zhang, Liang

AU - Xu, Qiang

AU - Li, Xiang

AU - Xiong, Lan Tian

PY - 2007

Y1 - 2007

N2 - SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties.

AB - SiO2/ SiO2 nanocomposites dipped with silicon resin was ablated and the physical state and phase transformation were characterized. Trace impurity in raw material and compound obtained by chemical reaction were analyzed. Moreover, the high-temperature dielectric properties were investigated. On the basis of above, it is found that the impurity carbon and silicon carbide are the key factors influencing dielectric properties.

KW - Ablation

KW - High-temperature dielectric properties

KW - Silicon dioxide

KW - Transformation

UR - http://www.scopus.com/inward/record.url?scp=33947230173&partnerID=8YFLogxK

U2 - 10.4028/0-87849-410-3.1239

DO - 10.4028/0-87849-410-3.1239

M3 - Article

AN - SCOPUS:33947230173

SN - 1013-9826

VL - 336-338 II

SP - 1239

EP - 1241

JO - Key Engineering Materials

JF - Key Engineering Materials

ER -

Ablated transformation and dielectric of SiO₂/SiO₂ nanocomposites dipped with silicon resin

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this