TY - GEN
T1 - A vacuum encapsulation technique with novel parasitic optimization methods for VHF MEMS resonators
AU - Zhao, Jicong
AU - Yuan, Quan
AU - Luo, Wei
AU - Kan, Xiao
AU - Zhang, Jinying
AU - Yang, Jinling
AU - Yang, Fuhua
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/2/26
Y1 - 2016/2/26
N2 - This paper presents a vacuum encapsulation technique with novel parasitic optimization methods for VHF MEMS resonators. Sn-rich Au-Sn solder bonding is used to achieve reliable hermetic packaging with high shear strength. An equivalent circuit model of the packaged resonator is established to analyze the parasitic effect caused by encapsulation. Reduction of the parasitic effect is achieved via grounding sealing ring, and decreasing overlap between sealing ring and VHF traces. The measured frequency spectrum of a packaged resonator was not distorted by parasitic effect, which was well consistent with the simulation result. Besides, the Q values of the resonator increase from 6600 to 10400 due to vacuum encapsulation.
AB - This paper presents a vacuum encapsulation technique with novel parasitic optimization methods for VHF MEMS resonators. Sn-rich Au-Sn solder bonding is used to achieve reliable hermetic packaging with high shear strength. An equivalent circuit model of the packaged resonator is established to analyze the parasitic effect caused by encapsulation. Reduction of the parasitic effect is achieved via grounding sealing ring, and decreasing overlap between sealing ring and VHF traces. The measured frequency spectrum of a packaged resonator was not distorted by parasitic effect, which was well consistent with the simulation result. Besides, the Q values of the resonator increase from 6600 to 10400 due to vacuum encapsulation.
UR - http://www.scopus.com/inward/record.url?scp=84970956416&partnerID=8YFLogxK
U2 - 10.1109/MEMSYS.2016.7421690
DO - 10.1109/MEMSYS.2016.7421690
M3 - Conference contribution
AN - SCOPUS:84970956416
T3 - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
SP - 573
EP - 576
BT - MEMS 2016 - 29th IEEE International Conference on Micro Electro Mechanical Systems
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 29th IEEE International Conference on Micro Electro Mechanical Systems, MEMS 2016
Y2 - 24 January 2016 through 28 January 2016
ER -