A study on the grain orientation and grain boundary of electroformed copper

Li Ya Guan*, Xiu Hua Zheng, Fu Chi Wang, Shu Kui Li

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

The microstructure, grain orientation and grain boundary in electroformed copper prepared under specific conditions were studied using SEM, TEM and EBSD. SEM and TEM observations showed that the microstructure of electroformed copper along the thickness direction of deposition consists of fine equiaxed grains zone, mixture zone of equiaxed and columnar grains and large columnar grain zone. EBSD analysis indicates that distributing the ratio of low-angle grain boundary(<15°)is lower and high-angle grain boundary (≥15°) is the dominating boundary in the electroformed copper. The high angle boundaries are mainly CSL and the ratio of ∑3 among CSL is relatively high. Columnar grains consist of parallel twin lamellar of which the normal is along the thickness direction. In the fine equiaxed grains zone, the preferred orientation of grains is not obvious. In mixture zone and large columnar grain zone, the preferred orientations of grains are <111> and <101>. Large columnar grain zone shows strong <111> texture.

Original languageEnglish
Pages (from-to)235-239
Number of pages5
JournalBeijing Ligong Daxue Xuebao/Transaction of Beijing Institute of Technology
Volume30
Issue number2
Publication statusPublished - Feb 2010

Keywords

  • EBSD
  • Electroformed copper
  • Grain boundary character distribution
  • Preferred orientation

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